Research Papers

Characterization of layered scattering media using polarized light measurements and neural networks

[+] Author Affiliations
Kai Y. Yong, Stephen P. Morgan, Ian M. Stockford, Mark C. Pitter

University of Nottingham, School of Electrical and Electronic Engineering, University Park, Nottingham, NG7 2RD, UK E-mail: steve.morgan@nottingham.ac.uk

J. Biomed. Opt. 8(3), 504-511 (Jul 01, 2003). doi:10.1117/1.1578090
History: Received Dec. 9, 2002; Revised Mar. 14, 2003; Accepted Mar. 14, 2003; Online July 18, 2003
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Measurements of the spatial distributions of polarized light backscattered from a two-layer scattering medium are used to train a neural network. We investigated whether the absorption coefficients and thickness of the layer can be determined when the scattering properties are known. When determining the absorption of the upper layer or the layer’s thickness, polarized light measurements provide better performance than unpolarized measurements, demonstrating the sensitivity of polarized light to superficial tissue. Determination of the lower layer’s absorption coefficient is not improved by polarized light measurements. Prior knowledge of the tissue under investigation is also beneficial because errors are reduced if the range of absorption or thickness is restricted. © 2003 Society of Photo-Optical Instrumentation Engineers.

© 2003 Society of Photo-Optical Instrumentation Engineers

Citation

Kai Y. Yong ; Stephen P. Morgan ; Ian M. Stockford and Mark C. Pitter
"Characterization of layered scattering media using polarized light measurements and neural networks", J. Biomed. Opt. 8(3), 504-511 (Jul 01, 2003). ; http://dx.doi.org/10.1117/1.1578090


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