Research Papers

Confidence intervals on fit parameters derived from optical reflectance spectroscopy measurements

[+] Author Affiliations
Arjen Amelink, Dominic J. Robinson, Henricus J. C. M. Sterenborg

Erasmus Medical Centre Rotterdam, Center for Optical Diagnostics and Therapy, Department of Radiation Oncology, 3000 CA Rotterdam, The Netherlands

J. Biomed. Opt. 13(5), 054044 (September 22, 2008). doi:10.1117/1.2982523
History: Received April 14, 2008; Revised July 03, 2008; Accepted July 03, 2008; Published September 22, 2008
Text Size: A A A

We validate a simple method for determining the confidence intervals on fitted parameters derived from modeling optical reflectance spectroscopy measurements using synthetic datasets. The method estimates the parameter confidence intervals as the square roots of the diagonal elements of the covariance matrix, obtained by multiplying the inverse of the second derivative matrix of χ2 with respect to its free parameters by χ2v, with v the number of degrees of freedom. We show that this method yields correct confidence intervals as long as the model used to describe the data is correct. Imperfections in the fitting model introduces a bias in the fitted parameters that greatly exceeds the estimated confidence intervals. We investigate the use of various methods to identify and subsequently minimize the bias in the fitted parameters associated with incorrect modeling.

Figures in this Article
© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Arjen Amelink ; Dominic J. Robinson and Henricus J. C. M. Sterenborg
"Confidence intervals on fit parameters derived from optical reflectance spectroscopy measurements", J. Biomed. Opt. 13(5), 054044 (September 22, 2008). ; http://dx.doi.org/10.1117/1.2982523


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.