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Research Papers

Confidence intervals on fit parameters derived from optical reflectance spectroscopy measurements

[+] Author Affiliations
Arjen Amelink, Dominic J. Robinson, Henricus J. C. M. Sterenborg

Erasmus Medical Centre Rotterdam, Center for Optical Diagnostics and Therapy, Department of Radiation Oncology, 3000 CA Rotterdam, The Netherlands

J. Biomed. Opt. 13(5), 054044 (April 14, 2008July 03, 2008July 03, 2008September 22, 2008). doi:10.1117/1.2982523
History: Received April 14, 2008; Revised July 03, 2008; Accepted July 03, 2008; Published September 22, 2008
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We validate a simple method for determining the confidence intervals on fitted parameters derived from modeling optical reflectance spectroscopy measurements using synthetic datasets. The method estimates the parameter confidence intervals as the square roots of the diagonal elements of the covariance matrix, obtained by multiplying the inverse of the second derivative matrix of χ2 with respect to its free parameters by χ2v, with v the number of degrees of freedom. We show that this method yields correct confidence intervals as long as the model used to describe the data is correct. Imperfections in the fitting model introduces a bias in the fitted parameters that greatly exceeds the estimated confidence intervals. We investigate the use of various methods to identify and subsequently minimize the bias in the fitted parameters associated with incorrect modeling.

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© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Arjen Amelink ; Dominic J. Robinson and Henricus J. C. M. Sterenborg
"Confidence intervals on fit parameters derived from optical reflectance spectroscopy measurements", J. Biomed. Opt. 13(5), 054044 (April 14, 2008July 03, 2008July 03, 2008September 22, 2008). ; http://dx.doi.org/10.1117/1.2982523


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