A method to locate an absorber embedded in a semi-infinite turbid medium by spatially-resolved continuous-wave (SRCW) diffuse reflectance measurements is introduced. The depth of the absorber is assessed by single wavelength SRCW diffuse reflectance measurements by two detectors in a radial row. The ratio of perturbations introduced by the defect at two detectors is used to be matched with the ratio-versus-depth curve, which are generated by approximate formulas of continuous wave diffuse reflectance. The error due to approximation and the error in depth assessment are studied for different cases revealing favorable source-detector placements with respect to planar position of the defect. The effect of lateral displacement of the source with respect to defect is studied. A strategy to overcome errors introduced by erroneous prediction of background medium optical properties is suggested. Theoretical results indicate that the depth of the absorber can be obtained with 0.1 mm precision independent of its absorption coefficient and its size for the values chosen in the study. The approach is tested experimentally and it is observed that theoretical results fit with experimental data.