Special Section on Polarized Light for Biomedical Applications

Characterization of natural and irradiated nails by means of the depolarization metrics

[+] Author Affiliations
Sergey Savenkov, Yevgen Oberemok, Ivan Kolomiets, Kateryna Chunikhina

Taras Shevchenko National University of Kyiv, Faculty of Radio Physics, Electronics and Computer Systems, Vladimirskaya Street 64, Kiev 01033, Ukraine

Alexander Priezzhev

Lomonosov Moscow State University, Department of Physics and International Laser Center, Vorobiovy Gory, Moscow 119992, Russia

Sergey Sholom

Oklahoma State University, Department of Physics, 145 Physical Sciences Building, Stillwater, Oklahoma 74078, United States

J. Biomed. Opt. 21(7), 071108 (Feb 26, 2016). doi:10.1117/1.JBO.21.7.071108
History: Received October 1, 2015; Accepted February 4, 2016
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Abstract.  Mueller polarimetry is applied to study the samples of nails: natural (or reference) and irradiated to 2 Gy ionizing radiation dose. We measure the whole Mueller matrices of the samples as a function of the scattering angle at a wavelength of 632.8 nm. We apply depolarization analysis to measured Mueller matrices by calculating the depolarization metrics [depolarization index, Q(M)-metric, first and second Lorenz indices, Cloude and Lorenz entropy] to quantify separability of the different samples of nails under study based on differences in their Mueller matrix. The results show that nail samples strongly depolarize the output light in backscattering, and irradiation in all cases results in increasing of depolarization. Most sensitive among depolarization metrics are the Lorenz entropy and Q(M)-metric.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Sergey Savenkov ; Alexander Priezzhev ; Yevgen Oberemok ; Sergey Sholom ; Ivan Kolomiets, et al.
"Characterization of natural and irradiated nails by means of the depolarization metrics", J. Biomed. Opt. 21(7), 071108 (Feb 26, 2016). ; http://dx.doi.org/10.1117/1.JBO.21.7.071108


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