Stimulated emission and spontaneous loss pump-probe microscopy for background removal

Subir Das; Bo-Wei Ho; Fu-Jen Kao

doi:10.1117/12.2284396

23 February 2018 Stimulated emission and spontaneous loss pump-probe microscopy for background removal

Subir Das, Bo-Wei Ho, Fu-Jen Kao

Proceedings Volume 10498, Multiphoton Microscopy in the Biomedical Sciences XVIII; 104982C (2018) https://doi.org/10.1117/12.2284396
Event: SPIE BiOS, 2018, San Francisco, California, United States

Abstract

In this work, we have established a double modulation lock-in detection technique using two semiconductor laser diodes in stimulated emission based pump-probe microscopy. By modulating the pump and probe beams at two different frequencies, f₁ and f₂, the signal is then recovered with the sum frequency, (f₁+ f₂), so as to minimize the leak-through noise due to the spontaneous emission caused by the pump beam. In this way, the DC background that is often attributed to the stimulated emission is effectively removed. Our technique has implemented in ATTO647N fluorescent dye which is applicable for many biological applications.

Citation Download Citation

Subir Das, Bo-Wei Ho, and Fu-Jen Kao "Stimulated emission and spontaneous loss pump-probe microscopy for background removal", Proc. SPIE 10498, Multiphoton Microscopy in the Biomedical Sciences XVIII, 104982C (23 February 2018); https://doi.org/10.1117/12.2284396

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