3D resolution-enhanced intensity diffraction tomographic microscopy

Jiaji Li; Alex Matlock; Yunzhe Li; Qian Chen; Lei Tian; Chao Zuo

doi:10.1117/12.2580271

7 October 2020 3D resolution-enhanced intensity diffraction tomographic microscopy

Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo

Proceedings Volume 11571, Optics Frontier Online 2020: Optics Imaging and Display; 115710P (2020) https://doi.org/10.1117/12.2580271
Event: Optics Frontiers Online 2020: Optics Imaging and Display (OFO-1), 2020, Shanghai, China

Abstract

We propose label-free and motion-free resolution-enhanced intensity diffraction tomography (reIDT) recovering the 3D complex refractive index distribution of an object. By combining an annular illumination strategy with a high numerical aperture (NA) condenser, we achieve near diffraction-limited lateral resolution of 346 nm and axial resolution of 1.2 μm over 130 × 130 × 8 μm³ volume. Our annular pattern matches the system’s maximum NA to reduce the data requirement to 48 intensity frames. The reIDT system is directly built on a standard commercial microscope with a simple LED array source and condenser lens adds-on, and promises broad applications for natural biological imaging with minimal hardware modifications. To test the capabilities of our technique, we present the 3D complex refractive index reconstructions on an absorptive USAF resolution target. Our work provides an important step in intensity-based diffraction tomography towards high resolution imaging applications.

Citation Download Citation

Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, and Chao Zuo "3D resolution-enhanced intensity diffraction tomographic microscopy", Proc. SPIE 11571, Optics Frontier Online 2020: Optics Imaging and Display, 115710P (7 October 2020); https://doi.org/10.1117/12.2580271

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KEYWORDS

Light emitting diodes

Absorption

Image resolution

Tomography

Diffraction

3D image processing

3D acquisition

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