Presentation + Paper
5 March 2021 Extended depth of focus metal-induced energy transfer imaging with multiple axially shifted images
Author Affiliations +
Abstract
Because the axial resolution of an optical microscope is in the order of the wavelength of light, imaging a nano-scale object is very challenging. Many nanometer-sectioning imaging technics such as total internal reflection fluorescence (TIRF) microscopy and metal-induced energy transfer (MIET) imaging have been invented to overcome this limitation. However, the measurement ranges of these methods along the axial direction are too short to cover even a single cell. Here we propose a new long-measurement-range nanometer-sectioning imaging scheme by using MIET, focal plane shifting, and sophisticated signal analysis. We have verified the principle and the feasibility of our proposed method by using an artificial sample; it is shown that the axial measurement range is extended from 100 nm to 500 nm.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wonsang Hwang, Dongeun Kim, and Dugyoung Kim "Extended depth of focus metal-induced energy transfer imaging with multiple axially shifted images", Proc. SPIE 11658, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVIII, 1165808 (5 March 2021); https://doi.org/10.1117/12.2577339
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KEYWORDS
Energy transfer

Confocal microscopy

Microscopy

Image resolution

Luminescence

Molecular bridges

Optical microscopes

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