Paper
1 March 1991 Theoretical and practical aspects of real-time Fourier imaging
Dennis S. Grimard, Fred Lewis Terry Jr., Michael E. Elta
Author Affiliations +
Proceedings Volume 1392, Advanced Techniques for Integrated Circuit Processing; (1991) https://doi.org/10.1117/12.48946
Event: Processing Integration, 1990, Santa Clara, CA, United States
Abstract
This paper reports the theoretical and experimental sensitivity of Fourier imaging (Fl) and the Fourier imaging system (FIS)'' respectively. The theory based on scalar diffraction which specifies these sensitivities is presented and discussed. Specifically the theoretical sensitivity of the Fl technique at a wavelength of 633 nm is determined to be 0. 003 nm while the experimental sensitivity of the FIS is approximately 15 nm. Both of these figures utilize a one-dimensional 1-pm rectangular diffraction structure for their calculation.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis S. Grimard, Fred Lewis Terry Jr., and Michael E. Elta "Theoretical and practical aspects of real-time Fourier imaging", Proc. SPIE 1392, Advanced Techniques for Integrated Circuit Processing, (1 March 1991); https://doi.org/10.1117/12.48946
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Cited by 2 scholarly publications.
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KEYWORDS
Diffraction

Fourier transforms

Semiconducting wafers

Integrated circuits

Semiconductors

Real time imaging

Semiconductor manufacturing

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