New wavefront sensor for metrology of spherical surfaces

Stefan Goelz; Jeffrey J. Persoff; Groff D. Bittner; Junzhong Liang; Chi-Fu T. Hsueh; Josef F. Bille

doi:10.1117/12.48833

1 December 1991 New wavefront sensor for metrology of spherical surfaces

Stefan Goelz, Jeffrey J. Persoff, Groff D. Bittner, Junzhong Liang, Chi-Fu T. Hsueh, Josef F. Bille

Proceedings Volume 1542, Active and Adaptive Optical Systems; (1991) https://doi.org/10.1117/12.48833
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

In this paper an extension of the principle of the Hartmann-Shack wavefront sensor to the neasureirtent of the sphericity of a specular reflection surface is presented. The features of this widely usable system are discussed by means of the application of this approach to the modeling of surface aberrations of the cornea of the eye. The results of measurements performed with a first prototype on a set of stainless steel calibration spheres of different radii are shown.

Citation Download Citation

Stefan Goelz, Jeffrey J. Persoff, Groff D. Bittner, Junzhong Liang, Chi-Fu T. Hsueh, and Josef F. Bille "New wavefront sensor for metrology of spherical surfaces", Proc. SPIE 1542, Active and Adaptive Optical Systems, (1 December 1991); https://doi.org/10.1117/12.48833

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