Paper
28 October 1992 Laser light effects on force sensors in atomic-force microscopes
Maria Allegrini, Cesare Ascoli, Carlo Frediani, Tullio Mariani
Author Affiliations +
Proceedings Volume 1726, 1992 Shanghai International Symposium on Quantum Optics; (1992) https://doi.org/10.1117/12.130412
Event: 1992 Shanghai International Symposium on Quantum Optics, 1992, Shanghai, China
Abstract
We discuss recent experiments investigating the effects produced by laser irradiation of cantilevers utilized as force sensors in atomic force microscopy (AFM). Thermal and pressure effects are observed for cantilevers freely moving in air. Mechanical fluctuations of the cantilevers due to thermal noise of the environment have also been measured.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria Allegrini, Cesare Ascoli, Carlo Frediani, and Tullio Mariani "Laser light effects on force sensors in atomic-force microscopes", Proc. SPIE 1726, 1992 Shanghai International Symposium on Quantum Optics, (28 October 1992); https://doi.org/10.1117/12.130412
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Thermal effects

Sensors

Modulation

Atomic force microscope

Quantum optics

Atomic force microscopy

Microscopes

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