Holographic interference microscope for the investigation of surface-mounted devices

Jan Hornung; Guenther K.G. Wernicke

doi:10.1117/12.140383

2 March 1993 Holographic interference microscope for the investigation of surface-mounted devices

Jan Hornung, Guenther K.G. Wernicke

Proceedings Volume 1732, Holographics International '92; (1993) https://doi.org/10.1117/12.140383
Event: Holographics International '92, 1992, London, United Kingdom

Abstract

Holographic interferometry is a widely used tool for nondestructive testing of mechanical deformations. In connection with microscopy, it is also possible to investigate very small objects. However, due to the imaging system used to magnify the object, the visibility of the interference pattern is disturbed. This disturbance still remains even if the conjugated reconstruction is applied. To decrease the influence of the imaging system, the aperture must be of small size. To suppress the speckle effect, the hologram should be made as an image plane hologram.

Citation Download Citation

Jan Hornung and Guenther K.G. Wernicke "Holographic interference microscope for the investigation of surface-mounted devices", Proc. SPIE 1732, Holographics International '92, (2 March 1993); https://doi.org/10.1117/12.140383

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available