Paper
31 January 1994 From semiconductors to superconductors - diversity of applications of an FT-spectrometer in materials research
Fernando Romero-Borja, A. Hamed, N. Yu, Lowell L. Wood
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166631
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
A series of experiments is presented in which a Bomem DA8 FT spectrometer is used as the main analytic instrument to clarify different effects in materials research. Our applications of the instrument range from absorbance measurements in semiconducting materials to reflectance measurements on superconducting thin films. Effects such as the change in optical absorbance for C60 films are observed and confirmed by transport measurements. The results of ion implantation processes on boron carbide (B4C) can be monitored by spectral measurements and indicate that the mechanical properties of the second hardest material, after diamond, can be adequately modified for easier machining.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fernando Romero-Borja, A. Hamed, N. Yu, and Lowell L. Wood "From semiconductors to superconductors - diversity of applications of an FT-spectrometer in materials research", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166631
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KEYWORDS
Reflectivity

Superconductors

Absorbance

Semiconductors

Thin films

Spectroscopy

Analytical research

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