Infrared spectroscopy of molecular layers on metal and semiconductor surfaces

Mark A. Chesters; David A. Slater

doi:10.1117/12.166734

31 January 1994 Infrared spectroscopy of molecular layers on metal and semiconductor surfaces

Mark A. Chesters, David A. Slater

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166734
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

The applications of Fourier transform infrared spectroscopy in surface science are reviewed with examples of recent work on both metal and semiconductor surfaces. While a single external reflection is the preferred approach on metal surfaces it is demonstrated that a single pass transmission experiment is more effective for work on semiconductors. The ability of the RAIRS technique to differentiate species having only minor chemical differences is illustrated by recent work on the coadsorption of chlorine and ethene on a Ag(100) surface and the decomposition of dimethylzinc on a Pt(111) surface. Finally the potential for the use of the RAIRS technique for kinetic studies is illustrated by recent work on systems of relevance to inhomogeneous stratospheric chemistry.

Citation Download Citation

Mark A. Chesters and David A. Slater "Infrared spectroscopy of molecular layers on metal and semiconductor surfaces", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166734

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