Paper
18 March 1994 Rapid determination of flame temperature profiles using OH LIF on a limited number of rotational lines
Bradley A. Williams, James W. Fleming
Author Affiliations +
Abstract
Temperature profiles determined from LIF spatial profiles of six lines [A - X (1-0) band: R1(3), R1(10), R2(5), R2(8), R2(10), and P1(2)] agree well with values obtained from LIF spectral scans (282.6 - 281.0 nm) at fixed burner height in the luminous and post-flame zones. Typical uncertainties by this method are +/- 50 - 75 K which are satisfactory for purposes of flame modeling. Fewer lines did not consistently give good agreement. In the preheat zone, the profile method is subject to several systematic errors due in part to the high thermal and OH concentration gradients which affect any temperature measurement in this region. Temperature profiles can be obtained much faster and with similar accuracy using this method than those derived from an excitation spectrum for each desired position in the flame. The method is particularly attractive when temperature profiles for several different flames are desired.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bradley A. Williams and James W. Fleming "Rapid determination of flame temperature profiles using OH LIF on a limited number of rotational lines", Proc. SPIE 2122, Laser Applications in Combustion and Combustion Diagnostics II, (18 March 1994); https://doi.org/10.1117/12.171301
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KEYWORDS
Temperature metrology

Laser induced fluorescence

Data modeling

Luminescence

Laser energy

Absorption

Dye lasers

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