Pattern Recognition For Automatic Visual Inspection

K. S. Fu

doi:10.1117/12.933606

22 November 1982 Pattern Recognition For Automatic Visual Inspection

K. S. Fu

Proceedings Volume 0336, Robot Vision; (1982) https://doi.org/10.1117/12.933606
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.

Citation Download Citation

K. S. Fu "Pattern Recognition For Automatic Visual Inspection", Proc. SPIE 0336, Robot Vision, (22 November 1982); https://doi.org/10.1117/12.933606

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