Paper
25 November 1999 Polychromator five-channel x-ray/EUV spectrometer with imaging transmission grating for plasma diagnostics
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Abstract
A new multichannel x-ray/extreme ultra violet (EUV) spectrometer is developed for monitoring the time history of x-ray/EUV spectral line intensities from a hot plasma to estimate an electron density and temperature of plasmas. Each independently controlled channel includes a crystal (or multilayer mirror) and a fast x-ray diode. At the same time, an imaging transmission grating is applied to study a spatial distribution of spectral line intensities in a wide spectral region with time gated resolution. The multichannel spectrometer can be applied for measurements of polarization- dependent spectra which will be used for diagnostics of electron beams and measuring a magnetic field in z-pinch plasmas.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitry A. Fedin, Victor L. Kantsyrev, Bruno S. Bauer, Alla S. Shlyaptseva, and Igor Brytov "Polychromator five-channel x-ray/EUV spectrometer with imaging transmission grating for plasma diagnostics", Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); https://doi.org/10.1117/12.371101
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Cited by 2 scholarly publications.
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KEYWORDS
Spectroscopy

Diffraction gratings

Plasma

X-rays

Crystals

Diodes

Sensors

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