Effect of carrier drift on the characteristics of 1.55-um traveling-wave ridge-coplanar waveguide photodetector

Jeong-Hoon Lee; Soon-Chel Kong; Seung-Jin Lee; Young-Wan Choi

doi:10.1117/12.382119

13 April 2000 Effect of carrier drift on the characteristics of 1.55-μm traveling-wave ridge-coplanar waveguide photodetector

Jeong-Hoon Lee, Soon-Chel Kong, Seung-Jin Lee, Young-Wan Choi

Author Affiliations +

Proceedings Volume 3948, Photodetectors: Materials and Devices V; (2000) https://doi.org/10.1117/12.382119
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

Bandwidth of traveling-wave photodetectors is limited not only by the optical absorption coefficient and the velocity mismatches, but also by the drift time of photo-generated carriers in the i-layer. The bandwidth limitation effect of the optical absorption coefficient and the velocity mismatches have already been considered and analyzed by presenting the velocity-mismatch impulse response. In this paper, we present a modified velocity-mismatch impulse response considering the effect of the transit time. The modified impulse response is modeled by the optical waveguide analysis and the segmentation of i-layer. The frequency impulse response is also obtained by the FFT of the modified impulse response. It is found that bandwidth limitation effect of the transit time is more serious than the effect of velocity mismatch, especially at high frequency.

Citation Download Citation

Jeong-Hoon Lee, Soon-Chel Kong, Seung-Jin Lee, and Young-Wan Choi "Effect of carrier drift on the characteristics of 1.55-μm traveling-wave ridge-coplanar waveguide photodetector", Proc. SPIE 3948, Photodetectors: Materials and Devices V, (13 April 2000); https://doi.org/10.1117/12.382119

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