Paper
10 April 2000 Modeling and design of multiple buried junctions detectors for color systems development
Annick Alexandre, Gerard Sou, Mohamed Ben Chouikha, Mohamed Sedjil, Guo Neng Lu, George Alquie
Author Affiliations +
Proceedings Volume 4019, Design, Test, Integration, and Packaging of MEMS/MOEMS; (2000) https://doi.org/10.1117/12.382313
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, 2000, Paris, France
Abstract
Two novel integrated optical detectors called BDJ detector and BTJ detector have been developed in our laboratory. These two detectors have different applications: the BDJ detector elaborated in CMOS process can be used for wavelength or light flux detection while the BTJ detector based on a bipolar structure gives the trichromatics components of a light. To develop microsystems, we need simulation tools as SPICE model. So, we have elaborated a physical mode, proposed a parameters extraction method and study influence of different parameters for BDJ detectors. Simulations and measurements have validated these models. More, we prose a design of BTJ detectors for developing new color imaging systems.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Annick Alexandre, Gerard Sou, Mohamed Ben Chouikha, Mohamed Sedjil, Guo Neng Lu, and George Alquie "Modeling and design of multiple buried junctions detectors for color systems development", Proc. SPIE 4019, Design, Test, Integration, and Packaging of MEMS/MOEMS, (10 April 2000); https://doi.org/10.1117/12.382313
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Cited by 6 scholarly publications.
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KEYWORDS
Sensors

Diffusion

Absorption

Systems modeling

CMOS sensors

Data modeling

Electrons

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