Trapping of electrical charges and laser damage

Janick Bigarre; Patrick Hourquebie; Ludovic Doucet

doi:10.1117/12.472037

30 May 2003 Trapping of electrical charges and laser damage

Janick Bigarre, Patrick Hourquebie, Ludovic Doucet

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472037
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

The polishing of optical components introduces defects in subsurface that can contribute to the damage initiation and the decrease of optical performance. These defects can trap electric charges or could be precursors to color center. We have proposed to study subsurface defects generated by the surface finishing by using trapping of charges and cathodoluminescence measurements. These two techniques are complementary: the cathodoluminescence gives information on defects having radiative decay and the grounded current can also be sensitive to other defects having non-radiative decay. It is shown that they are able to distinguish the surface finishing of natural silica. The defects are mainly concentrated in the first micron layer. We have also found that the repartition of defects on the surface in not homogeneous.

Citation Download Citation

Janick Bigarre, Patrick Hourquebie, and Ludovic Doucet "Trapping of electrical charges and laser damage", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472037

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