Paper
17 November 2005 Enhancement of biomolecular detection sensitivity by surface plasmon resonance ellipsometry
Hyun Mo Cho, Won Chegal, Yong Jai Cho, Young-pil Kim, Hak-sung Kim
Author Affiliations +
Proceedings Volume 6008, Nanosensing: Materials and Devices II; 60081F (2005) https://doi.org/10.1117/12.630379
Event: Optics East 2005, 2005, Boston, MA, United States
Abstract
We present the application of ellipsometry to the phase measurement of surface plasmon resonance (SPR) in biomolecular detection. In this configuration, the phase measurement gives a large enhancement of detection sensitivity in comparison to traditional SPR techniques. In this work, the experimental setup for SPR ellipsometry is based on both custom-built rotating analyzer ellipsometer and an imaging ellipsometer which are equipped with a SPR-cell and a flow system, respectively. We investigate the adequate thickness of the gold layer used for SPR cell and the resolution of the phase detection using two ellipsometric methods under the SPR condition. The rotating analyzer method yields higher sensitivity sufficient to detect changes in the effective thickness of biomolecular layers of less than 1 pm. In comparison to conventional SPR the simultaneous measurement of ellipsometric parameters, Δ and ψ, yields more information which is useful for quantitative analysis based on fitting theoretical solutions to experimental results.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hyun Mo Cho, Won Chegal, Yong Jai Cho, Young-pil Kim, and Hak-sung Kim "Enhancement of biomolecular detection sensitivity by surface plasmon resonance ellipsometry", Proc. SPIE 6008, Nanosensing: Materials and Devices II, 60081F (17 November 2005); https://doi.org/10.1117/12.630379
Lens.org Logo
CITATIONS
Cited by 9 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ellipsometry

Gold

Phase measurement

Data modeling

Refractive index

Chromium

Imaging systems

Back to Top