Paper
9 December 2005 Wavelength measurement by polarization method
Nataliya D. Kundikova, Anastasiya M. Lonschakova
Author Affiliations +
Proceedings Volume 6024, ICO20: Optical Devices and Instruments; 60240C (2005) https://doi.org/10.1117/12.666816
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
The experimental and theoretical results, used for an adjustable quarter wave plate development, are proposed for the light wavelength measurement. To prove that idea propagation of coherent and incoherent light through an adjustable quarter wave plate with different properties was considered. The dependence of the adjustment angle on the light wavelength was obtained for different parameters of single retarder. All calculations were performed for mica retarders. It was shown principal possibility of light wavelength shift detection with accuracy 0.1 nm within wavelength range 3 nm for coherent light. Experimental investigation was performed for an adjustable quarter wave plate made of two mica plates of the same retardation. The qualitative coincidence between experimental and theoretical results has demonstrated.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nataliya D. Kundikova and Anastasiya M. Lonschakova "Wavelength measurement by polarization method", Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60240C (9 December 2005); https://doi.org/10.1117/12.666816
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KEYWORDS
Wave plates

Polarization

Mica

Phase shifts

Optical testing

Stereolithography

Light wave propagation

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