Paper
23 August 2013 High speed optical nanoscopy by stimulated emission depletion (STED) with galvo mirrors
Shuai Li, Cui-fang Kuang, Yi-fan Wang, Xiang Hao, Peng Xiu, Ying-ke Xu, Xu Liu
Author Affiliations +
Proceedings Volume 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications; 89110D (2013) https://doi.org/10.1117/12.2034070
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
Stimulated emission depletion microscopy (STED) has been proved to be a feasible and straightforward method of breaking the conventional diffraction barrier in the far-field. In this paper, we design and setup a home-built high speed STED microscope. Both the excitation beam (488nm) and the depletion beam (592nm) are provided by continuous wave lasers. By using a pair of galvo mirrors (TILL Yanus IV Digital Scan Head), we realize a pixel dwell time down to 2 μs in the experiment which enables an acquisition speed of 2 frames per second in an imaging field of 5*5 μm with an individual pixel size of 10nm. The image acquisition process is controlled by the software Imspector. In the manuscript, we give a clear description on how to build the microscope and also conduct several experiments to evaluate its performance in practice. A spatial resolution of <100nm, which is well beyond the diffraction barrier has been demonstrated in both nanoparticles and biomedical samples. Featuring a superresolution together with a high imaging speed, our STED microscope has big potential to be widely applied in related scientific researches.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuai Li, Cui-fang Kuang, Yi-fan Wang, Xiang Hao, Peng Xiu, Ying-ke Xu, and Xu Liu "High speed optical nanoscopy by stimulated emission depletion (STED) with galvo mirrors", Proc. SPIE 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications, 89110D (23 August 2013); https://doi.org/10.1117/12.2034070
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KEYWORDS
Stimulated emission depletion microscopy

Confocal microscopy

Mirrors

Microscopes

Diffraction

Luminescence

Microscopy

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