Paper
4 March 2015 White light interferometer with color CCD for 3D-surface profiling of microsystems
Author Affiliations +
Proceedings Volume 9302, International Conference on Experimental Mechanics 2014; 93023R (2015) https://doi.org/10.1117/12.2081117
Event: International Conference on Experimental Mechanics 2014, 2014, Singapore, Singapore
Abstract
White light interferometry (WLI) is a state-of-the-art technique for high resolution full-filed 3-D surface profiling of Microsystems. However, the WLI is rather slow, because the number of frames to be recorded and evaluated is large compared to the single wavelength phase shifting interferometry. In this paper, we combine white light interferometer with a single-chip color CCD camera which makes the measurement faster, simpler, and cost-effective. The red-bluegreen (RGB) color interferogram stored in a computer is then decomposed into its individual components and corresponding phase maps for red, green, and blue components are calculated independently. The usefulness of the technique is demonstrated on reflective micro-scale-samples.
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Paul Kumar Upputuri, Manojit Pramanik, Krishna Mohan Nandigana, and Mahendra Prasad Kothiyal "White light interferometer with color CCD for 3D-surface profiling of microsystems ", Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93023R (4 March 2015); https://doi.org/10.1117/12.2081117
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KEYWORDS
Profiling

Charge-coupled devices

Interferometers

Microsystems

Optical interferometry

CCD cameras

Phase shifts

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