Effect of wavefront aberrations on a focused plenoptic imaging system: a wave optics simulation approach

Massimo Turola; Chris J. Meah; Richard J. Marshall; Iain B. Styles; Stephen Gruppetta

doi:10.1117/12.2184621

21 June 2015 Effect of wavefront aberrations on a focused plenoptic imaging system: a wave optics simulation approach

Massimo Turola, Chris J. Meah, Richard J. Marshall, Iain B. Styles, Stephen Gruppetta

Proceedings Volume 9526, Modeling Aspects in Optical Metrology V; 95260X (2015) https://doi.org/10.1117/12.2184621
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

A plenoptic imaging system records simultaneously the intensity and the direction of the rays of light. This additional information allows many post processing features such as 3D imaging, synthetic refocusing and potentially evaluation of wavefront aberrations. In this paper the effects of low order aberrations on a simple plenoptic imaging system have been investigated using a wave optics simulations approach.

Citation Download Citation

Massimo Turola, Chris J. Meah, Richard J. Marshall, Iain B. Styles, and Stephen Gruppetta "Effect of wavefront aberrations on a focused plenoptic imaging system: a wave optics simulation approach", Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260X (21 June 2015); https://doi.org/10.1117/12.2184621

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