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13 March 2024 Resolving the hyperfine structure of rubidium with a speckle spectrometer
Chris Perrella, Gabriel Britto Monteiro, Erik Schartner, Sarah Scholten, Morgan Facchin, Andre N. Luiten, Graham D. Bruce, Kishan Dholakia
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Proceedings Volume PC12901, Complex Light and Optical Forces XVIII; PC1290107 (2024) https://doi.org/10.1117/12.2692765
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
Highly multi-mode media convert a coherent input field’s spatial profile into a granular speckle patterns. These speckle patterns are heavily dependent upon properties of the multi-mode medium and the input light field. Examining these speckle patterns enables extraction of these parameters; numerous spectrometers have been demonstrated by analyzing speckle. This is germane to precision measurement of optical wavelength, which is crucial in many applications including: laser spectroscopy, optical sensing, and laser locking. To the best of our knowledge we have demonstrated, for the first time, a transmission matrix method (TMM) speckle spectrometer capable of resolving the hyperfine structure of rubidium at 780nm. We compare this with other TMM speckle spectrometers in literature as well as discussing the advantages and disadvantages of the transmission matrix technique.
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Chris Perrella, Gabriel Britto Monteiro, Erik Schartner, Sarah Scholten, Morgan Facchin, Andre N. Luiten, Graham D. Bruce, and Kishan Dholakia "Resolving the hyperfine structure of rubidium with a speckle spectrometer", Proc. SPIE PC12901, Complex Light and Optical Forces XVIII, PC1290107 (13 March 2024); https://doi.org/10.1117/12.2692765
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KEYWORDS
Spectroscopy
Speckle
Rubidium
Speckle pattern
Matrices
Optical transmission
Principal component analysis
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