7 August 2015 Directed self-assembly cut mask assignment for unidirectional design
Jiaojiao Ou, Bei Yu, Jhih-Rong Gao, David Z. Pan
Author Affiliations +
Abstract
Recently, directed self-assembly (DSA) has emerged as a promising lithography solution for cut manufacturing. We perform a comprehensive study on the DSA aware mask optimization problem to provide a DSA friendly design on cut layers. We first formulate the problem as an integer linear programming (ILP) to assign cuts to different guiding templates, targeting both conflict minimization and line-end extension minimization. As ILP may not be scalable for very large size problems, we then propose two speed-up strategies. The first one is to decompose the initial problem into smaller ones and solve them separately, followed by solution merging without much loss of quality. The second one is using the set cover algorithm to decide the DSA guiding pattern assignment, and then legalize the template placement. Our approaches can be naturally extended to handle arbitrary DSA guiding template patterns with complicated shapes. Experimental results show that our methodologies can significantly improve the DSA friendly, i.e., both the unresolved pattern number and the line-end extensions can be reduced.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) 1932-5150/2015/$25.00 © 2015 SPIE
Jiaojiao Ou, Bei Yu, Jhih-Rong Gao, and David Z. Pan "Directed self-assembly cut mask assignment for unidirectional design," Journal of Micro/Nanolithography, MEMS, and MOEMS 14(3), 031211 (7 August 2015). https://doi.org/10.1117/1.JMM.14.3.031211
Published: 7 August 2015
Lens.org Logo
CITATIONS
Cited by 20 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Directed self assembly

Photomasks

Lithography

Metals

Manufacturing

Computer programming

Source mask optimization

RELATED CONTENT


Back to Top