Ufuk Yilmaz
at Technische Univ Wien
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 March 2023 Presentation + Paper
Proceedings Volume 12392, 1239209 (2023) https://doi.org/10.1117/12.2651424
KEYWORDS: Image registration, Atomic force microscopy, Infrared imaging, Chemometrics, Proteins, Polymers, Fluorescence, Infrared radiation, Image processing, Spatial resolution, Atomic force microscope, Nanoimaging

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