PROCEEDINGS VOLUME 8563
PHOTONICS ASIA | 5-7 NOVEMBER 2012
Optical Metrology and Inspection for Industrial Applications II
Editor Affiliations +
IN THIS VOLUME

9 Sessions, 41 Papers, 0 Presentations
3D Methods I  (3)
NDT Methods  (2)
Proceedings Volume 8563 is from: Logo
PHOTONICS ASIA
5-7 November 2012
Beijing, China
Front Matter: Volume 8563
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856301 (2013) https://doi.org/10.1117/12.2017914
Metrology Modeling and Simulation
Samuel Choi, Heiichi Kato, Osami Sasaki, Takamasa Suzuki
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856302 (2012) https://doi.org/10.1117/12.999555
Yang Li, Qian Zhou, Kai Ni, Guanhao Wu, Xiaorui Qiao
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856303 (2012) https://doi.org/10.1117/12.999976
Lei Lu, Jiangtao Xi, Yanguang Yu, Limei Song
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856304 (2012) https://doi.org/10.1117/12.1000086
Ke Chen, Jiangtao Xi, Yanguang Yu, Limei Song
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856305 (2012) https://doi.org/10.1117/12.1000087
Metrology Calibration
Jia Tang, Ming Zhang, Liqiang Wang
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856306 (2012) https://doi.org/10.1117/12.999811
Honggang Lu, Chunsheng Hu, Xingshu Wang, Yang Gao, Wei Wu
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856307 (2012) https://doi.org/10.1117/12.2000586
X. M. Du, Jiajun Gu, K. G. Harding
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856308 (2012) https://doi.org/10.1117/12.2001247
Dong Li, Jindong Tian, Xin Yang
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856309 (2012) https://doi.org/10.1117/12.2001255
Metrology Applications I
Ryota Mizutani, Tomoharu Ishikawa, Miyoshi Ayama, Yukitoshi Otani
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630A (2012) https://doi.org/10.1117/12.999829
Osami Sasaki, Akihiro Watanabe, Samuel Choi, Takamasa Suzuki
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630B (2012) https://doi.org/10.1117/12.2000145
M. Aketagawa, M. Madden, S. Uesugi, T. Kumagai, Y. Maeda, E. Okuyama
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630C (2012) https://doi.org/10.1117/12.2000812
3D Methods I
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630F (2012) https://doi.org/10.1117/12.999801
Anand Asundi, Huang Lei, Teoh Kang Min Eden, Parthasarathy Sreemathy, Watt Sook May
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630G (2012) https://doi.org/10.1117/12.1000032
Yi Liao, Robert Tait, Kevin Harding, Edward J. Nieters, Wayne C. Hasz, Nicole Piche
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630H (2012) https://doi.org/10.1117/12.2000283
3D Methods II
Jesús Díaz Díaz, Maik Rahlves, Omid Majdani, Eduard Reithmeier, Tobias Ortmaier
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630J (2012) https://doi.org/10.1117/12.999276
Takamasa Suzuki, Noriaki Yamada, Osami Sasaki, Samuel Choi
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630K (2012) https://doi.org/10.1117/12.999720
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630L (2012) https://doi.org/10.1117/12.999878
Armote Somboonkaew, Ratthasart Amarit, Sataporn Chanhorm, Boonsong Sutapun
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630M (2012) https://doi.org/10.1117/12.999967
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630N (2012) https://doi.org/10.1117/12.2000462
Metrology Applications II
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630O (2012) https://doi.org/10.1117/12.999609
Longhai Liu, Aijun Zeng, Beishi Chen, Lexing Zheng, Huijie Huang
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630P (2012) https://doi.org/10.1117/12.999670
Takamasa Suzuki, Katsunori Nakano, Shogo Muramatsu, Toshiro Oitate
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630Q (2012) https://doi.org/10.1117/12.999726
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630R (2012) https://doi.org/10.1117/12.2000179
NDT Methods
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630U (2012) https://doi.org/10.1117/12.999617
Irina V. Semenova, Galina V. Dreiden, Karima R. Khusnutdinova, Alexander M. Samsonov
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630V (2012) https://doi.org/10.1117/12.999709
Poster Session
Feng-jiao Liu, Wang Zhou, Guo-qiang Chen, Hong gen Yi
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630W (2012) https://doi.org/10.1117/12.999269
Youwei Huang, Weizhen Cheng, Yan Li, Wanxin Li
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630X (2012) https://doi.org/10.1117/12.999279
Jia Ge, Yunhan Luo, Jun Zhang, Long Guo, Liang Sun, Zhe Chen
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85630Y (2012) https://doi.org/10.1117/12.999324
Liuyi Ling, Pinhua Xie, Min Qin, Renzhi Hu, Nina Zheng, Fuqi Si
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856310 (2012) https://doi.org/10.1117/12.999572
Lin Cai, Nianchun Deng, Zexin Xiao
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856312 (2012) https://doi.org/10.1117/12.999765
Kazuhide Kamiya, Takashi Nomura, Ami Tanbo, Matsumoto Kimihisa, Tashiro Hatsuzou, Shinya Suzuki
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856313 (2012) https://doi.org/10.1117/12.999769
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856314 (2012) https://doi.org/10.1117/12.999797
Yanhui Li, Zhensen Wu, Lu Bai
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856315 (2012) https://doi.org/10.1117/12.999870
Haoyun Wei, Xuejian Wu, Lei Zhou, Jitao Zhang, Yan Li
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856316 (2012) https://doi.org/10.1117/12.999955
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856317 (2012) https://doi.org/10.1117/12.999965
Yingwei He, Limin Xiong, Haifeng Meng, Junchao Zhang, Dingpu Liu, Jieyu Zhang
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856318 (2012) https://doi.org/10.1117/12.981437
Fengjie Zheng, Tao Yu, Xingfeng Chen, Jiping Chen, Guoti Yuan
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 856319 (2012) https://doi.org/10.1117/12.2000652
Honggang Lu, Chunsheng Hu, Xingshu Wang, Yang Gao
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85631A (2012) https://doi.org/10.1117/12.2001199
Chunxiao Zhi, Jinghua Sun
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85631E (2012) https://doi.org/10.1117/12.999580
Proceedings Volume Optical Metrology and Inspection for Industrial Applications II, 85631G (2012) https://doi.org/10.1117/12.982012
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