Paper
22 September 1983 Applied Engineering And Technology Simulated LWIR Targets Scenario In Low Optical Background
Rudolf E. Schatzmann
Author Affiliations +
Abstract
The development and operation of a ground-based facility designed for spectral and spatial simulation of long-wavelength infrared ) optical target scenarios under low radiant background and hard vacuum conditions required the integration of many engineering disciplines and the merging of associated science and technology. The unique features and capabilities of the Advanced Sensor Evaluation and Test (ASET) facility will be discussed. Single and multiple point target simulation sources with controllable irradiance cover a large dynamic irradiance range of nearly Planckian and complex spectral characteristics, as well as variable extended targets for optical background simulatio.. An overview of the collimator subsystem presenting the simulated targets optically at infinity and the scanning mirrors subsystem providing scan capability over several degrees across the field of view will augment the description. An overview of the cryogenic support subsystem will complete the ASET facility description. The ASET facility computer syste s will be described, including computer aided facility operation and test data acquisition and processing capability.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rudolf E. Schatzmann "Applied Engineering And Technology Simulated LWIR Targets Scenario In Low Optical Background", Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); https://doi.org/10.1117/12.935933
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Mirrors

Computing systems

Optical fabrication

Black bodies

Data modeling

Long wavelength infrared

RELATED CONTENT

Radiometric Test Chamber For Earth-Looking Sensors
Proceedings of SPIE (December 28 1982)
Lockheed sensor test facility: a 1990 update
Proceedings of SPIE (September 01 1990)
Low Background Testing At Honeywell
Proceedings of SPIE (September 22 1983)
Test stations: a modular approach
Proceedings of SPIE (June 10 1996)

Back to Top