Adaptation Of A WYKO LADITE Interferometer To Another Wavelength

Jay H. Lowry; John H. Belk

doi:10.1117/12.947182

4 August 1988 Adaptation Of A WYKO LADITE Interferometer To Another Wavelength

Jay H. Lowry, John H. Belk

Proceedings Volume 0941, Automated Testing of Electro-Optical Systems; (1988) https://doi.org/10.1117/12.947182
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

The software and computing power of the WYKO LADITE interferometer make it a desirable tool in applications that are outside the factory set wavelength. However, the focus shift involved in going from the factory set wavelength to, for example, Nd:YAG's 1.06 micron line introduces systematic errors. This paper describes a method to refocus the commercially available instrument without compromising measurement accuracy. This modification allowed testing of a high quality laser system at its operational wavelength.

Citation Download Citation

Jay H. Lowry and John H. Belk "Adaptation Of A WYKO LADITE Interferometer To Another Wavelength", Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); https://doi.org/10.1117/12.947182

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