Paper
24 November 2016 Imaging ellipsometer with large field-of-view
Liyuan Gu, Aijun Zeng, Shiyu Hu, Qiao Yuan, Weilin Cheng, Shanhua Zhang, Guohang Hu, Hongbo He, Huijie Huang
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Abstract
A polarizer-compensator-sample-analyzer (PCSA) imaging ellipsometer with large field of view is presented. The sample is imaged on a CCD sensor by a telecentric imaging system and its tilt is monitored by an optical autocollimator. The sample, the telecentric imaging system and the CCD sensor satisfy the Scheimpflug condition. In measurement, the light extinction measurement method and the four quadrants average method are used to improve the accuracy. In experiments, a chromium thin film sample is measured by the imaging ellipsometer and a spectroscopic ellipsometer. The measurement results by two ellipsometers are consistent. The usefulness of the imaging ellipsometer is verified.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liyuan Gu, Aijun Zeng, Shiyu Hu, Qiao Yuan, Weilin Cheng, Shanhua Zhang, Guohang Hu, Hongbo He, and Huijie Huang "Imaging ellipsometer with large field-of-view", Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002315 (24 November 2016); https://doi.org/10.1117/12.2247848
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KEYWORDS
Imaging systems

Optical testing

CCD image sensors

Polarizers

Autocollimators

Thin films

Mineralogy

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