An adhered-particle analysis system based on concave points

Wencheng Wang; Fengnian Guan; Lin Feng

doi:10.1117/12.2309453

13 April 2018 An adhered-particle analysis system based on concave points

Wencheng Wang, Fengnian Guan, Lin Feng

Author Affiliations +

Proceedings Volume 10696, Tenth International Conference on Machine Vision (ICMV 2017); 106960S (2018) https://doi.org/10.1117/12.2309453
Event: Tenth International Conference on Machine Vision, 2017, Vienna, Austria

Abstract

Particles adhered together will influence the image analysis in computer vision system. In this paper, a method based on concave point is designed. First, corner detection algorithm is adopted to obtain a rough estimation of potential concave points after image segmentation. Then, it computes the area ratio of the candidates to accurately localize the final separation points. Finally, it uses the separation points of each particle and the neighboring pixels to estimate the original particles before adhesion and provides estimated profile images. The experimental results have shown that this approach can provide good results that match the human visual cognitive mechanism.

Citation Download Citation

Wencheng Wang, Fengnian Guan, and Lin Feng "An adhered-particle analysis system based on concave points", Proc. SPIE 10696, Tenth International Conference on Machine Vision (ICMV 2017), 106960S (13 April 2018); https://doi.org/10.1117/12.2309453

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