Fast Measurement Of Refractive Index Profile Parameters ▵ And ∝ In Preforms And Waveguides. Method Of Interference With Plane Wave Of Reference

W. Kowalik

doi:10.1117/12.952957

30 January 1990 Fast Measurement Of Refractive Index Profile Parameters ▵ And ∝ In Preforms And Waveguides. Method Of Interference With Plane Wave Of Reference

W. Kowalik

Author Affiliations +

Proceedings Volume 1085, Optical Fibres and Their Applications V; (1990) https://doi.org/10.1117/12.952957
Event: Optical Fibers and Their Applications V, 1989, Warsaw, Poland

Abstract

A method of fast measurement of parameters ▵ and ∝ describing refractive index profile of preforms and waveguides is discussed. The measurements are performed by means of interference method with plane wave of reference. This method enables application of a simple interferogram scanning, and the calculations resolve themselves into solving of a quadratic equation.

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W. Kowalik "Fast Measurement Of Refractive Index Profile Parameters ▵ And ∝ In Preforms And Waveguides. Method Of Interference With Plane Wave Of Reference", Proc. SPIE 1085, Optical Fibres and Their Applications V, (30 January 1990); https://doi.org/10.1117/12.952957

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