Paper
30 January 1989 Evaporated Fatty Acid Resist Process
Hisato Kato, Shinzo Morita, Masahiro Tawata, Shuzo Hattori
Author Affiliations +
Abstract
Double layer resist process using fatty acid and Al was proposed for fine pattern fabrication. Oriented thin films of stearic acid and w-tricosenoic acid were formed on an Al evaporated substrate by evaporation using a furnace with an orifice of a few mm diameter. Electron beam exposure characteristics of the films were studied and 2um L/S pattern was successfully developed by heating the substrate and C12 etching of Al.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hisato Kato, Shinzo Morita, Masahiro Tawata, and Shuzo Hattori "Evaporated Fatty Acid Resist Process", Proc. SPIE 1086, Advances in Resist Technology and Processing VI, (30 January 1989); https://doi.org/10.1117/12.953035
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KEYWORDS
Aluminum

Crystals

Diffraction

Electron beams

Photoresist processing

Silicon

Etching

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