Simultaneous multi-wavelength laser spot detection and beam wander measurement using novel polymer imaging system

Prajnesh Kumar; Ting Bu; Dayu Zhang; Rainer Martini

doi:10.1117/12.2519231

13 May 2019 Simultaneous multi-wavelength laser spot detection and beam wander measurement using novel polymer imaging system

Prajnesh Kumar, Ting Bu, Dayu Zhang, Rainer Martini

Author Affiliations +

Proceedings Volume 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI; 109801C (2019) https://doi.org/10.1117/12.2519231
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States

Abstract

Comparison of optical propagation properties in different wavelength regimes are difficult to measure, especially in continuous varying environment. Detector and measurement equipment are typically optimized for specific spectral band and utilize matching amplifiers with have different response and process time making it hard or impossible to match time sensitive data. In this paper we propose the use of a wavelength conversion imaging system which has a broad spectral response and large detector size for synchronous multi-wavelength measurement. We showcase the strength of this approach in comparing the effect of turbulence media on a 1.55 μm and a 4 μm lasers at ambient (20 °C), 45 °C and 75 °C air temperature. Recording the movement and size of the lasers spot and comparing it frame to frame allows for extraction of the effect of turbulence on the individual lasers. Furthermore using cross correlation technique the conditions under which a good comparison can be identified. The result shows peak at 0s time shift for 45 °C and 75 °C which confirms the correlated measurement while the beam wander shows no correlation for ambient temperature as it is random.

Citation Download Citation

Prajnesh Kumar, Ting Bu, Dayu Zhang, and Rainer Martini "Simultaneous multi-wavelength laser spot detection and beam wander measurement using novel polymer imaging system", Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109801C (13 May 2019); https://doi.org/10.1117/12.2519231

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KEYWORDS

Sensors

Imaging systems

Liquid crystals

Short wave infrared radiation

Cameras

Mid-IR

Optical testing

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