New optomechanical probing methods for high-precision sensing (Conference Presentation)

Thomas Purdy

doi:10.1117/12.2552691

27 March 2020 New optomechanical probing methods for high-precision sensing (Conference Presentation)

Thomas Purdy

Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 1129624 (2020) https://doi.org/10.1117/12.2552691
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

"New optomechanical probing methods for high-precision sensing" was recorded at Photonics West 2020, in San Francisco, California.

Conference Presentation

Citation Download Citation

Thomas Purdy "New optomechanical probing methods for high-precision sensing (Conference Presentation)", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129624 (27 March 2020); https://doi.org/10.1117/12.2552691

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