Ray Tracing Of X-Ray Optical Systems: Source Models.

Franco Cerrina

doi:10.1117/12.961842

27 November 1989 Ray Tracing Of X-Ray Optical Systems: Source Models.

Franco Cerrina

Proceedings Volume 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation; (1989) https://doi.org/10.1117/12.961842
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

We describe the implementation of the source models used by SHADOW, our X-ray optics ray tracing code. The statistical nature of the models is discussed in detail and some relevant examples presented. The program can now model all the types of sources encountered in synchrotron radiation, that is bending magnets, wigglers bnd undulators with full inclusion of emittance effects.

Citation Download Citation

Franco Cerrina "Ray Tracing Of X-Ray Optical Systems: Source Models.", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961842

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