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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, edited by Jigui Zhu, Kexin Xu, Hai Xiao, Sen Han, Proceedings of SPIE Vol. 11439 (SPIE, Bellingham, WA, 2020) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510636569 ISBN: 9781510636576 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2020, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $21.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/20/$21.00. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Bai, Jinpeng, 0T Bi, Yanqiang, 0L, 0R Bu, Zean, 06 Cao, Changqing, 1C Cao, Danhua, 04 Chang, Xu, 13 Chen, Dong, 1F Chen, Fan, 0U Chen, Longhui, 1Q Chen, Qian, 10, 15, 1M Chen, Xianlei, 1R Chen, Yongxia, 14, 1D Cui, Yaoyao, 1D Dang, Qian, 1O Deng, Junwu, 0R Ding, Dan, 0E Dong, Bing, 0J Dong, Hang, 06 Dong, Kaixian, 1H Dong, Long, 1J Du, Yinfei, 1D Duan, Xiaodeng, 0M Fan, Chao, 0L, 0R Fan, JingJing, 1N Fan, Ying, 16 Feng, Guojin, 07 Feng, Qibo, 0A, 12 Feng, Zhejun, 1C Fu, Beibei, 14, 1D Fu, Luhua, 09 Fu, Min, 0U Fu, Xi hong, 1O Fu, Yangting, 1G, 1P Gan, Haiyong, 1G, 1P Gan, Xiaochuan, 0S Gao, Janmin, 19 Gao, Qinghua, 1L Gao, Shen, 1D Gao, Wen, 0L Gao, Yang, 0Z Gu, Guohua, 10, 15, 1M Guo, Sasa, 17 Guo, Tong, 03 Guo, Xiaohu, 0K Han, Yanna, 0J Hao, Huadong, 1R Hao, Junjie, 19 Hao, Qun, 0C, 13 He, Qixin, 0A He, Weiji, 10, 15, 1M He, Yingwei, 1G, 1P Hu, Xinqi, 0J Hu, Yao, 0C, 13 Hu, Yutong, 08 Huang, Junhui, 19 Ji, Yue, 0D Jia, Qishen, 1D Jia, Siyuan, 14 Jia, Xinlin, 0W, 1A, 1F Jian, Yabin, 1L Jiang, Junfeng, 1H Jiang, Xingru, 04 Jing, Xufeng, 1P Jing, Zekun, 0W, 1A, 1F Kang, Jiehu, 0M Kang, Shi-fa, 1O Kou, Ke, 0Q Li, Changli, 0U Li, Cunjun, 1R Li, Guohong, 1R Li, Hongru, 0S Li, Jianhui, 0O, 0Y Li, Jiliang, 09 Li, Jing, 1C Li, Mingjia, 1Q Li, Nana, 0O Li, Qing, 14 Li, Qiong, 1L Li, Shuo, 1O Li, Tengfei, 0K LI, Ting, 02 Li, Xin, 1E Li, Xingfei, 0D Li, Xiyuan, 0L Li, Yan, 0S Li, Yanling, 1E Li, Yanqiu, 0O, 0Y Li, Yuanyao, 14, 1D Li, Yue, 05 Li, Zechuan, 1E Li, Zhaoming, 0E Li, Zixiong, 0W, 1A, 1F Lian, Tianhong, 0Q Liang, Xu, 0V Liao, Yurong, 0E Lin, Boying, 0L Lin, Cunbao, 0E Lin, Jiarui, 0V, 18, 1I Liu, Changjie, 0W, 1A, 1F Liu, Guangtong, 0G Liu, Guoqing, 0L, 0R Liu, Jingjing, 11 Liu, Jun, 17 Liu, Ke, 0Y Liu, Kun, 1H Liu, Lizhe, 04 Liu, Ruixi, 1J Liu, Tiantian, 1S, 1T Liu, Tiegen, 1H Liu, Wende, 1G, 1P Liu, Xiangliang, 1G, 1P Liu, Yang, 0V Liu, Zeyuan, 1L Long, Changyu, 0G Long, Yuan, 05 Lu, Lihua, 13 Lu, Ruijun, 14 Luo, Shuang, 11 Luo, Ying, 07 Ma, Na-na, 1O Ma, Xiaosu, 0S Ma, Xinyu, 12 Mao, Yuxin, 0K Niu, Zhenqi, 0H Niu, Zhiyuan, 1I Pan, Xin, 0T Pan, Yijie, 0I Qiu, Chao, 15 Qiu, Zhi, 10 Qu, Jiansu, 0S Qu, Xinghua, 0X Ran, Yunfeng, 0A Ren, Rubiao, 0P Ren, Yongjie, 1I Ren, Yu, 1K Rong, Weigang, 10, 15 Ruan, Guowei, 0G Shang, Yonghong, 1L Shen, Changyu, 1G, 1P Shi, Haolei, 1R Shi, Shendong, 18 Shl, Hailin, 0U Sun, Anbin, 1N Sun, Changku, 06, 09, 0F, 0P, 1B Sun, Xueyin, 0C Tao, Li, 0G Tu, YiMeng, 0A Tuo, Weixiao, 0D Wang, Bosong, 0I Wang, Cuo, 0Q Wang, Guoqing, 0W Wang, He, 0I Wang, Jiahan, 08 Wang, Jiazhi, 0O Wang, Jing, 0L, 0R Wang, Jinqiang, 1J Wang, Lifang, 1A Wang, Peng, 05, 06, 08, 09, 0F, 0P, 1B Wang, Peng, 1D Wang, Ping, 02 Wang, Shaopu, 0C Wang, Shuang, 1H Wang, Wei, 0G Wang, Wen, 16 Wang, Xiaoming, 14 Wang, Xiaoyong, 1M Wang, Xin, 0I Wang, Ye, 0Y Wang, Yingying, 1R Wang, Yunzhi, 1Q Wang, Zhao, 19 Wang, Zhe, 16 Wang, Zhong, 14 Wang, Ziwen, 0G Wei, Taoran, 04 Weng, Jun, 0Q Weng, Qianwen, 03 Wu, Bin, 0M Wu, Jun, 08 Wu, Jun, 1E Wu, Tengfei, 0V Wu, Ze’nan, 1R Wu, Zhiyang, 1H Xia, Yifan, 1M Xiao, Yike, 1G, 1P Xie, Fang, 1Q Xu, Haibo, 1Q Xu, Huizhong, 1R Xu, Jun, 1E Xu, Ke, 0R Xu, Min, 0H Xu, Nan, 1G, 1P Xu, Tingting, 08 Xu, Xueyang, 0H Xue, Li, 1O Xue, Ting, 0M Yan, Kejun, 17 Yang, Linghui, 0T, 0V, 18, 1I Yang, Liuni, 11 Yang, Shundong, 1H Yang, Suhui, 0I Yang, Wanglin, 15 Ye, Mingzhe, 0C Yu, Caizhi, 05 Yu, Xiaoyu, 0U Yu, Xu-dong, 02 Zeng, Xiaodong, 1C Zhang, Bin, 0G Zhang, Bin, 12 Zhang, Bing, 0Z Zhang, Chengli, 0G Zhang, Fumin, 0X Zhang, Hui, 0T Zhang, Ke, 17 Zhang, Lu, 1S, 1T Zhang, Tao, 14, 16 Zhang, Tao, 14, 1D Zhang, Wenwen, 10, 15 Zhang, Xiangchao, 0H Zhang, Yingjie, 1B Zhang, Yuhang, 0G Zhang, Zhen, 0M Zhang, Zhenyu, 18 Zhang, Zhi-qiang, 02 Zhao, Guanhua, 03 Zhao, Tiekun, 10 Zhao, Weirui, 1S, 1T Zhao, Xiangyu, 1L Zhao, Xianyu, 0X Zhao, Yuejin, 1S, 1T Zhao, Ziyue, 0N, 1N Zheng, Caiyun, 04 Zheng, Fajia, 12 Zheng, Hui, 1D Zheng, Xiang-ke, 1O Zhong, Wenting, 17 Zhou, Duo, 0P, 1B Zhou, Guodong, 0O, 0Y Zhou, Jie, 1H Zhou, Yu-mei, 02 Zhu, Ge, 0U Zhu, Jigui, 0V, 18, 1I Zhu, Rui, 0H Zou, Zhi, 1N Zu, Yahui, 0F Symposium CommitteesSymposium Chairs Symposium Committee
Technical Program Chair Technical Program Co-chairs Local Organizing Committee Chair Local Organizing Committee Co-chairs
General Secretary Administrative Vice General Secretaries
Vice General Secretaries Local Organizing Committee
Conference CommitteeConference Chairs
Conference Program Committee
Conference Secretary Session Chairs
IntroductionWith the deepening and intensification of information, a wider range of information sources and acquisition methods have become the basis for societal development. Because of its large capacity, high efficiency and high precision, optoelectronic measurement technology has become the main means of information sensing and acquisition. It has and will continue to play an important role in important fields such as consumer electronics, industrial manufacturing, environmental protection, and scientific research. The optoelectronic measurement research covers a rich variety of content including lots of areas from scientific research, manufacturing industry, to daily life and the scope will continue to be expanded and the content to be more and more in-depth. On one hand, traditional optoelectronic measurement research and application represented by the background of industrial measurement and optoelectronic detection have been constantly improved and concerned performances have been constantly improved as well. On the other hand, the needs of optoelectronic measurement represented by the optical interferometry and optical dynamic measurement have been emerging ceaselessly, as well as the continued development of measuring methods and applications. More than 60 manuscripts have been accepted (2 invited manuscripts and 21 oral presentations) in the branch of OIT 2019—Optoelectronic Measurement Technology and Systems, ranging many research fields including optoelectronic measurement, optical instruments, industrial metrology, optical interferometry, optical fiber sensing, etc. These manuscripts appropriately reflect the current focusing problems and research level of the optoelectronic measurement field. Jigui Zhu Kexin Xu Hai Xiao Sen Han Conference Organizers
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