Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements

M. Sheik-bahae; A. A. Said; T. H. Wei; Y. Y. Wu; D. J. Hagan; M. J. Soileau; E. W. Van Stryland

doi:10.1117/12.962142

4 January 1990 Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements

M. Sheik-bahae, A. A. Said, T. H. Wei, Y. Y. Wu, D. J. Hagan, M. J. Soileau, E. W. Van Stryland

Proceedings Volume 1148, Nonlinear Optical Properties of Materials; (1990) https://doi.org/10.1117/12.962142
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n₂ measurements of BaF₂ using picosecond frequency doubled Nd:YAG laser pulses.

Citation Download Citation

M. Sheik-bahae, A. A. Said, T. H. Wei, Y. Y. Wu, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland "Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements", Proc. SPIE 1148, Nonlinear Optical Properties of Materials, (4 January 1990); https://doi.org/10.1117/12.962142

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