Poster + Presentation + Paper
20 June 2021 Recognition of small areas of activity by the pointwise intensity-based dynamic speckle analysis
E. Stoykova, N. Berberova, B. Blagoeva, D. Nazarova, L. Nedelchev, A. Machikhin
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Conference Poster
Abstract
Industrial inspection of processes by capture of speckle patterns often requires detection of a small activity area buried in a background. This work presents analysis of sensitivity of the dynamic speckle method by processing simulated and experimental correlated in time 8 bit encoded speckle patterns. Simulation of the patterns was done for an exponentially decreasing temporal correlation function of intensity fluctuations by Fresnel propagation of a monochromatic wave reflected from a delta-correlated in time phase screen and captured at different diameters and focal distances of the optical sensor objective lens. For the experiment, we used a 3D printed flat object with hollow sections that was covered with a transparent film and a droplet of a polymer solution and monitored the process of their drying. Both normalized and non-normalized processing algorithms were used.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Stoykova, N. Berberova, B. Blagoeva, D. Nazarova, L. Nedelchev, and A. Machikhin "Recognition of small areas of activity by the pointwise intensity-based dynamic speckle analysis", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821U (20 June 2021); https://doi.org/10.1117/12.2592600
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KEYWORDS
Speckle

Speckle pattern

Speckle analysis

Temporal resolution

Polymers

Refractive index

Reliability

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