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1 August 2021 Metrological aspects of holographic microscopy and tomography
Małgorzata Kujawińska
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Proceedings Volume 11817, Applied Optical Metrology IV; 118170F (2021) https://doi.org/10.1117/12.2596326
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States
Abstract
The 50th anniversary of Dennis Gabor’s Nobel prize (1971) and the upcoming 60th anniversary of the work of both Yuri N. Denisyuk (1962) and Emmett N. Leith, Juris Upatnieks (1962) are excellent reasons to look back at the inventions and the great pioneers of holography. In the talk at first I present my personal look at the timeline of optical and digital holography with focus on 2D and 3D holographic microscopy. Next I will address several metrological problems connected with 2D and 3D quantitative phase imaging based on data gathered by means of digital holography microscopy, holographic tomography and combined holographic tomography and optical coherence tomography .
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© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Małgorzata Kujawińska "Metrological aspects of holographic microscopy and tomography", Proc. SPIE 11817, Applied Optical Metrology IV, 118170F (1 August 2021); https://doi.org/10.1117/12.2596326
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KEYWORDS
Holography
Microscopy
Tomography
Metrology
Digital holography
Optical coherence tomography
3D metrology
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