Finite element simulation investigation of surface height difference in diamond cutting of bi-crystal aluminum

Shi Qiu; Chunyu Zhang; Guo Li; Junjie Zhang; Liang Zhao; Shijin Lu; Chengwei Song; Haijun Zhang; Yandi Huang

doi:10.1117/12.2624560

27 March 2022 Finite element simulation investigation of surface height difference in diamond cutting of bi-crystal aluminum

Shi Qiu, Chunyu Zhang, Guo Li, Junjie Zhang, Liang Zhao, Shijin Lu, Chengwei Song, Haijun Zhang, Yandi Huang

Author Affiliations +

Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 121695S (2022) https://doi.org/10.1117/12.2624560
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China

Abstract

Polycrystalline aluminum elements with optical surface quality are widely used in optical fields, such as inertial confinement fusion (ICF) fusion target and optical reflection mirrors, etc. However, the surface height difference induced by elastic deformation after cutting strongly affect the surface quality of polycrystalline aluminum precision parts. In this paper, a crystal plasticity finite element (CPFE) model of the single point diamond cutting for bi-crystal aluminum material was firstly established through the software ABAQUS with the VUMAT subroutine. The surface height difference in diamond cutting of bi-crystal aluminum was investigated by the FE simulations. The surface height difference between grains after machining was extracted from the simulation results, and the suppression law of height difference caused by material properties and cutting parameters was investigated, which provides a theoretical basis for realizing high-quality surface control.

Citation Download Citation

Shi Qiu, Chunyu Zhang, Guo Li, Junjie Zhang, Liang Zhao, Shijin Lu, Chengwei Song, Haijun Zhang, and Yandi Huang "Finite element simulation investigation of surface height difference in diamond cutting of bi-crystal aluminum", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 121695S (27 March 2022); https://doi.org/10.1117/12.2624560

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