X-ray dark-field tomography using edge-illumination

Adam Doherty; Savvis Savidis; Alberto Astolfo; Lorenzo Massimi; Nargiza Djurabekova; Carlos Navarrete Leon; Mattia F. M. Gerli; Francesco Iacoviello; Paul Shearing; Danielle Norman; Mark A. Williams; Alessandro Olivo; Marco Endrizzi

doi:10.1117/12.2632731

10 November 2022 X-ray dark-field tomography using edge-illumination

Adam Doherty, Savvis Savidis, Alberto Astolfo, Lorenzo Massimi, Nargiza Djurabekova, Carlos Navarrete Leon, Mattia F. M. Gerli, Francesco Iacoviello, Paul Shearing, Danielle Norman, Mark A. Williams, Alessandro Olivo, Marco Endrizzi

Author Affiliations +

Proceedings Volume 12242, Developments in X-Ray Tomography XIV; 1224209 (2022) https://doi.org/10.1117/12.2632731
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States

Abstract

X-ray dark-field imaging is used to visualize the ultra-small angle x-ray scattering signal that originates from sub-resolution density fluctuations within the sample microstructure. Dark-field tomography using the edge-illumination x-ray imaging system is presented as a tool for measuring this scattering signal in a sample in three dimensions. Its applicability to different fields is shown through example images of a multi-material phantom, a tissue-engineered esophagus, a pouch cell battery and a short-fiber reinforced composite material. The multichannel contrast available in edge-illumination helps with material identification, with high contrast at boundaries enhancing dark-field reconstructions.

Conference Presentation

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Adam Doherty, Savvis Savidis, Alberto Astolfo, Lorenzo Massimi, Nargiza Djurabekova, Carlos Navarrete Leon, Mattia F. M. Gerli, Francesco Iacoviello, Paul Shearing, Danielle Norman, Mark A. Williams, Alessandro Olivo, and Marco Endrizzi "X-ray dark-field tomography using edge-illumination", Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 1224209 (10 November 2022); https://doi.org/10.1117/12.2632731

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