Gratings-based phase contrast imaging provides additional materials signatures that can enhance detection for security screening. However, screening of larger objects requires more penetrating energies, which presents a challenge to gratings-based systems: more penetrating x-rays are more difficult to pattern, while the cross sections for small angle scattering are reduced. We present a study of phase contrast x-ray imaging at endpoint energies above 160 kV, discussing pattern visibility, spectral corrections, and detection of material microstructure. We then discuss considerations for potential implementation.
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