High-speed spectral confocal signal collection method based on acquisition and tracking algorithm with variable window-width

Yongchao Wang; Kaili Ren; Lei Liang; Baomeng Hao; Jihong Liu

doi:10.1117/12.2687648

27 November 2023 High-speed spectral confocal signal collection method based on acquisition and tracking algorithm with variable window-width

Yongchao Wang, Kaili Ren, Lei Liang, Baomeng Hao, Jihong Liu

Author Affiliations +

Proceedings Volume 12769, Optical Metrology and Inspection for Industrial Applications X; 1276905 (2023) https://doi.org/10.1117/12.2687648
Event: SPIE/COS Photonics Asia, 2023, Beijing, China

Abstract

Spectral confocal technology is widely used in the field of object contour scanning with non-contact measurement. For high-speed collection of spectral confocal signal, the collection speed is not only related to the integration time of the photodetector but limited by the efficiency of reading out the spectral signal from the detector. In order to solve this problem, a spectral confocal signal collection method based on acquisition and tracking algorithm with variable window width is proposed to improve the data collection efficiency. The algorithm improves collection efficiency by only collecting the useful signals in the spectrum. The simulation results show that the signal collection efficiency with the proposed algorithm for the CMOS sensor is improved significantly compared to the conventional method. For smooth object surfaces, the data collection efficiency is improved above 44.5 times. It is proved that the proposed method in this paper providing a novel approach for implementing high-speed collection of spectral confocal signal.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yongchao Wang, Kaili Ren, Lei Liang, Baomeng Hao, and Jihong Liu "High-speed spectral confocal signal collection method based on acquisition and tracking algorithm with variable window-width", Proc. SPIE 12769, Optical Metrology and Inspection for Industrial Applications X, 1276905 (27 November 2023); https://doi.org/10.1117/12.2687648

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