Presentation + Paper
9 April 2024 High speed 2D material visualization by using a microscopic dynamic spectroscopic imaging ellipsometer
Author Affiliations +
Abstract
This paper describes the lateral resolution enhancement of dynamic spectroscopic imaging ellipsometer, aiming to improve its inspection capabilities. Traditional imaging ellipsometers use a rotating optical elements type scheme which typically requires longer acquisition time. Moreover, for spectroscopic applications, an extra spectral scanning mechanism is needed. The proposed system based on a one-piece polarizing interferometric module, can efficiently extract spatio-spectral ellipsometric phase maps of two-dimensional (2D) materials with a spatial resolution of a few microns at a speed of hundreds of Hz.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Choi, G. Hwang, S. Kheiryzadehkhanghah, I. Choi, W. Chegal, Y. Cho, and D. Kim "High speed 2D material visualization by using a microscopic dynamic spectroscopic imaging ellipsometer", Proc. SPIE 12955, Metrology, Inspection, and Process Control XXXVIII, 129550F (9 April 2024); https://doi.org/10.1117/12.3010995
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KEYWORDS
2D materials

Inspection

Imaging systems

Spatial resolution

Visualization

Metrology

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