Paper
29 December 2023 Research on unattended vision inspection system for petrochemical industry based on 5G
Tielin Lu, Lei Yue, Xiaojing Liu, Yujia Shang, Xiawei Feng, Jie Gao
Author Affiliations +
Proceedings Volume 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023); 129760W (2023) https://doi.org/10.1117/12.3008807
Event: 8th Asia Pacific Conference on Optics Manufacture & 3rd International Forum of Young Scientists on Advanced Optical Manufacturing, 2023, Shenzhen, China
Abstract
Nowadays, lots of vision devices have set in the industry process. The vision detect results from the devices have higher requirements for data storage and network transmission. Unattended vision detection technology has become the key research directions of multispectral optoelectronic devices. However, it has different needs about the architecture of the 5G network and how to design the system with unattended work for petrochemical industry. So it is quit necessary to find a root to study optoelectronic device using 5G network, in order to get the real-time transmission of results, and edge processing. This paper introduces the architecture unattended inspection system for petrochemical industry 5G network, composition system of multispectral optoelectronic devices. Finally, we have developed a use case of unattended vision inspection architecture based on 5G network structure. And also we have analysis the related applications in the petrochemical industry application scenario.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Tielin Lu, Lei Yue, Xiaojing Liu, Yujia Shang, Xiawei Feng, and Jie Gao "Research on unattended vision inspection system for petrochemical industry based on 5G", Proc. SPIE 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023), 129760W (29 December 2023); https://doi.org/10.1117/12.3008807
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KEYWORDS
Inspection

Industry

Image processing

Industrial applications

Optoelectronic devices

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