PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Variations in the average refractive index
and thickness of the holographic recording
material are present due to chemical processing.
These changes produce a reordering of the
internal structure of the interference fringes so
we can see that the processed material and the
registered material are different. In this paper
we have analyzed the influences of exposure and
geometric disposition of the recording beams on
the variations of the maximum diffraction
efficiency.
Our previous resarch1 has shown that the
parameter used to analyze the influences of the
thickness and index variations is defined as:
(formula available on paper)
where T = t/t and N =QR(t and n represent
the thickness and the refractive index of the
medium, respectively); aR, and a the
angles in relation to the normal for holograms.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Augusto Belendez, Inmaculada V. Pascual, Antonio Fimia, "Experimental results in thickness and index variations to the analysis of holographic aberrations," Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); https://doi.org/10.1117/12.22152