Paper
1 November 1990 Surface-enhanced Raman spectroscopy for remote sensing
Tuan Vo-Dinh, David L. Stokes, Gordon H. Miller, Job M. Bello, Eric A. Wachter, John W. Haas III, David R. James
Author Affiliations +
Abstract
Conventional Raman spectroscopy is often limited by its low sensitivity due to the inherently weak Raman cross section of organic chemicals. A relatively new detection technique, Surface-Enhanced Raman Scattering (SERS) spectroscopy is based on recent experimental observations, which have indicated enhancement of the Raman scattering efficiency by factors of up to 106 when a compound is adsorbed on rough metallic surfaces that have submicron-scale protrusions. In this report we discuss the development of the SERS technique as a tool for monitoring hazardous chemical emissions and its application to in situ remote sensing.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tuan Vo-Dinh, David L. Stokes, Gordon H. Miller, Job M. Bello, Eric A. Wachter, John W. Haas III, and David R. James "Surface-enhanced Raman spectroscopy for remote sensing", Proc. SPIE 1336, Raman and Luminescence Spectroscopies in Technology II, (1 November 1990); https://doi.org/10.1117/12.22921
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KEYWORDS
Surface enhanced Raman spectroscopy

Raman spectroscopy

Spectroscopy

Raman scattering

Fiber optics

Analytical research

Luminescence

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