Measurement of high-speed photodiodes using DFB heterodyne system with microwave reflectometer

David A. Humphreys

doi:10.1117/12.137707

3 September 1992 Measurement of high-speed photodiodes using DFB heterodyne system with microwave reflectometer

David A. Humphreys

Proceedings Volume 1680, High-Speed Electronics and Optoelectronics; (1992) https://doi.org/10.1117/12.137707
Event: Semiconductors '92, 1992, Somerset, NJ, United States

Abstract

A reflectometer technique using scalar optoelectronic measurements has been proposed to correct source mismatch errors. The merits of different detector configurations and the measurement system requirements have been discussed. A GaInAs photodiode has been measured to 40 GHz using a DFB laser heterodyne system. Results corrected for source mismatch using reflection coefficient measurements have been compared with results measured by the reflectometer technique. Agreement between the two corrected optoelectronic responses is better than 0.2 dB.

Citation Download Citation

David A. Humphreys "Measurement of high-speed photodiodes using DFB heterodyne system with microwave reflectometer", Proc. SPIE 1680, High-Speed Electronics and Optoelectronics, (3 September 1992); https://doi.org/10.1117/12.137707

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